N&K Technology, Inc.

Disk Metrology

DUV-Vis-NIR (Wavelength Range: 190nm – 1000nm) Thin Film Only Metrology System for Magnetic Disks

The n&k 1500-D measures unpolarized reflectance (R) to determine the optical properties (n and k) from 190nm – 1000nm, and thicknesses of thin films, in particular diamond-like carbon (DLC) and magnetic layers, comprising hard disks. This manual load system with automated stage has an extremely low CoO, and is designed to handle all sizes of hard disks. With a 1mm spot size, the raw reflectance data is acquired over a wide wavelength range (190nm – 1000nm) with optimized signal-to-noise ratio. The n&k 1500-D is capable of accurately measuring thickness, as well as Hydrogen and Nitrogen content of increasingly thinner DLC, independent of any variations in the magnetic layers.