FARO

FARO

A-32, Block B1, Block B, Mohan Cooperative Industrial Estate, Badarpur, New Delhi, Delhi 110044

FARO Quantum Max ScanArms

FARO Quantum Max ScanArms

FARO® Quantum Max ScanArms

The global standard in non-contact measurement arm technology

Sometimes a part or tool is so complex, you can’t use contact probes to capture all of its measurements. But lasers do the job with exceptional speed and accuracy. In these cases, leading manufacturers rely on FARO Quantum Max ScanArms, which combine the measurement capabilities of a Quantum Max FaroArm portable coordinate measuring machine (CMM) with the non-contact functionality of a laser line probe. The Quantum Max also offers three LLPs that optimize accuracy, speed or a blend of both, depending on project need. Whichever LLP you choose, 3D ScanArms capture precise measurements in nearly any environment, from the factory floor to the field.

ScanArm Features

Family of Laser Line Probes (LLPs)

Achieve high-speed point cloud capture, high accuracy or a blend of both with three LLPs, each hot swappable and purpose built.

Multiple Working Volumes

Meet the needs of any application with working volumes of 2.0m, 2.5m, 3m, 3.5m and 4m.

Continuous Light Rectification (CLR) Technology

Scan dark, reflective or translucent surfaces.

Smart Probe Capability

Quickly and easily change probes without recalibration.

Internal Counterbalancing

Operate with a single hand and without fatigue.

Ergonomic Design

Transport, set up and operate ScanArms with ease and comfort.

Exclusive 8-axis Integration

Quickly measure all sides of a part without repositioning.

Compliance

Meet rigorous ISO 10360-12 accuracy standards.

Universal Quick Mount

Set up a ScanArm wherever it’s needed.

Temperature and Overload Sensors

Ensure continuous, optimum performance.

Powerful Software Solutions

Easily integrate ScanArms and software.

Extended Battery Use Option

Operate without cables.

High-speed Wireless Operation

Connect with Bluetooth or Wi-Fi.

Rugged Design

Use ScanArms even in the most challenging measurement environments.

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