Elemaster SpA

Parametric Tests

Parametric Tests

Elemaster offers different testing solutions to guarantee customers the full functionality of the products and maximum reliability over time.

We have the most advanced machines for In-Circuit Tests (ICT) using “Bed of Nails” and Flying Probe technology. Elemaster Test Engineering Team has extensive expertise in developing solutions for ICT testing on bed of nails platforms such as:

• Keysight (Agilent)
• Teradyne
• GenRad
• SPEA

and on Flying Probe platforms:

• Spea 4040
• Spea 4050
• Spea 4060

The process is integrated with On-Board and Boundary Scan programming steps to ensure the highest quality of the production output.

The Boundary Scan test can be performed using different approaches:

• Embedded in the circuit test sequence
• Standalone via XJTAG platform
• Embedded in the functional test sequence