Electronic SYSTEMS S.p.A.

Essair Duplex

Essair Duplex

ESSAIR™ DUPLEX is a measurement technology, patented by Electronic Systems, ideal for direct thickness measurement without contact.

MAIN FEATURES

• It does not make use of any type of radioactive sources.
• Direct thickness measurement expressed in micron or mm.
• No contact with the material.
• Automatic calibration system.

ESSAIR™  DUPLEX is installed on standard scanners for measurement in transmission mode, and is particularly suitable for rigid materials or for materials with a very highwinding tension measurement.

The sensor can be personalised depending on specific needs required by the application:

• Edges detector• Security system to detect lumps and/or extra thickness (lump-detector), external to the measurement system

ESSAIR™  DUPLEX sensor is assembled on board of the following screening devices with its own reference roll between the ones included in the range of Electronic Systems products:

• SLIM DUPLEX