Ametek

Materials Analysis and Imaging

Leader in secondary Ion Mass spectrometer (SIMs), electron Probe Microanalysis (ePMA), Low-energy electron induced X-ray emission spectrometry (LeXes), and atom Probe tomography (ATP). Innovative materials characterization systems encompassing energy dispersive spectrometry (EDS), and Wavelength dispersive spectrometry (WDS) for Microanalysis, electron Backscatter diffraction (EBSD), crystallographic analysis via TEM electron diffraction, and Micro X-ray Fluorescence (XRF). Broad array of atomic spectroscopic instrumentation used to analyze the elemental composition of solids and liquids using optical emission, energy dispersive X-ray fluorescence (EDXRF), ICP, or ICP mass spectrometry measurement techniques for a variety of end markets. High-speed digital imaging systems used in defense, automotive, engineering, science, medical research, industrial manufacturing and packaging, sports and entertainment, and digital cinematography for television and movie production.