SHANGHAI, March 20, 2019 /PRNewswire/ -- Today at Semicon China 2019, Thermo Fisher Scientific unveiled its latest and most advanced focused ion beam scanning electron microscope (FIB-SEM) for nanometer scale materials characterization and analysis, the Thermo Scientific Helios 5 DualBeam microscope. The Helios 5 DualBeam FIB-SEM will be available in HX, FX and UX c Read more...
SHANGHAI, March 20, 2019 /PRNewswire/ -- Today at Semicon China 2019, Thermo Fisher Scientific unveiled its latest and most advanced focused ion beam scanning electron microscope (FIB-SEM) for nanometer scale materials characterization and analysis, the Thermo Scientific Helios 5 DualBeam microscope. The Helios 5 DualBeam FIB-SEM will be available in HX, FX and UX c Read more...
PLEASANTON, Calif., and OBERKOCHEN, Germany, Feb. 4, 2020 /PRNewswire/ -- ZEISS today introduced the ZEISS Crossbeam Laser – a new family of site-specific focused ion beam scanning electron microscope (FIB-SEM) solutions that accelerate package failure analysis and process optimization for advanced semiconductor packages. Integratin Read more...
