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SHANGHAI, March 20, 2019 /PRNewswire/ -- Today at Semicon China 2019, Thermo Fisher Scientific unveiled its latest and most advanced focused ion beam scanning electron microscope (FIB-SEM) for nanometer scale materials characterization and analysis, the Thermo Scientific Helios 5 DualBeam microscope. The Helios 5 DualBeam FIB-SEM will be available in HX, FX and UX c Read more...

SHANGHAI, March 20, 2019 /PRNewswire/ -- Today at Semicon China 2019, Thermo Fisher Scientific unveiled its latest and most advanced focused ion beam scanning electron microscope (FIB-SEM) for nanometer scale materials characterization and analysis, the Thermo Scientific Helios 5 DualBeam microscope. The Helios 5 DualBeam FIB-SEM will be available in HX, FX and UX c Read more...